doi: 10.7763/IJET.2024.V16.1255
The Impact of Predictability and Fault Tolerance on Reliability in Microelectronic Device Design and Manufacturing
- 1 South China University of Technology, Guangzhou, Guangdong Province, China
- 2 Shenzhen Arcadia Grammar School, Shenzhen, Guangdong Province, China
- Manuscript received December 27, 2023
- revised January 10, 2024
- accepted January 22, 2024
- published March 26, 2024
Abstract
This article thoroughly examines the crucial role of predictive analytics and fault tolerance mechanisms in enhancing the reliability of microelectronic devices throughout their design and manufacturing processes. Emphasizing the importance of implementing these measures across the entire lifecycle, including design, manufacturing, and application phases, the study adopts a comprehensive approach. The methodology integrates predictive analytics tools and fault tolerance mechanisms, proactively identifying and mitigating potential issues early on. Results demonstrate a significant reduction in device failures, showcasing the transformative impact of these technologies. Overall, the research advocates for the strategic integration of predictive analytics and fault tolerance mechanisms to advance the reliability of microelectronic devices across diverse applications.
Keywords
- microelectronics
- reliability
- predictive analytics
- fault tolerance
- design
- manufacturing
How to Cite
Yadi Lin and Wendi Lin, "The Impact of Predictability and Fault Tolerance on Reliability in Microelectronic Device Design and Manufacturing," International Journal of Engineering and Technology, vol. 16, no. 1, pp. 57-60, 2024. https://doi.org/ 10.7763/IJET.2024.V16.1255
Copyright & License
Copyright © 2024 by the authors. This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).