Abstract—We developed recently a new and novel Metric Matrics k-means (MMk-means) clustering algorithm to cluster genes to their functional roles with a view of obtaining further knowledge on many P. falciparum genes. To further pursue this aim, in this study, we compare three different k-means algorithms (including MMk-means) results from an in-vitro microarray data (Le Roch et al., Science, 2003) with the classification from an in-vivo microarray data (Daily et al., Nature, 2007) in other to perform a comparative functional classification of P. falciparum genes and further validate the effectiveness of our MMk-means algorithm. Results from this study indicate that the resulting distribution of the comparison of the three algorithms’ in vitro clusters against the in vivo clusters are similar thereby authenticating our MMk-means method and its effectiveness. However, Daily et al. claim that the physiological state (the environmental stress response) of P. falciparum in selected malaria-infected patients observed in one of their clusters can not be found in any in-vitro clusters is not true as our analysis reveal many in-vitro clusters representation in this cluster.
Index Terms—clustering algorithm; effectiveness; functional classification; malaria parasite; genes; in-vivo; in-vitro; microarray.
V. C. Osamor is with the Bioinformatics Unit, Department of Computer and Information Sciences, College of Science and Technology, Covenant University, Ota, Ogun State, Nigeria (corresponding author e-mail: vcosamor@ gmail.com).
E. F. Adebiyi is with the Bioinformatics Unit, Department of Computer and Information Sciences, College of Science and Technology, Covenant University, Ota, Ogun State, Nigeria. (e-mail: email@example.com).
S. Doumbia is with the Malaria Research Training Centre, University of Bamako, Mali, Africa. (e-mail: sdoumbi@MRTCBKO.org).
Cite: Victor Chukwudi Osamor, Ezekiel Femi Adebiyi and Seydou Doumbia, "Clustering Plasmodium falciparum Genes to their Functional Roles Using k-means," International Journal of Engineering and Technology vol. 2, no. 2, pp. 215-225, 2010.