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General Information
    • ISSN: 1793-8236 (Online)
    • Abbreviated Title Int. J. Eng. Technol.
    • Frequency:  Quarterly 
    • DOI: 10.7763/IJET
    • Managing Editor: Ms. Jennifer Zeng
    • Abstracting/ Indexing: Inspec (IET), CNKI Google Scholar, EBSCO, ProQuest, Crossref, etc.
    • E-mail: ijet_Editor@126.com
Editor-in-chief
IJET 2016 Vol.8(5): 334-337 ISSN: 1793-8236
DOI: 10.7763/IJET.2016.V8.908

Study on Reliability Model of Multistate Phased Mission System Based on BDD

Tao Hu and Chun Hui Yang

Abstract—In engineering application, there are many systems whose mission often involves several different tasks or phases that must be accomplished in sequence. At the same time, some systems are composed of multistate components, which have different performance levels where one cannot formulate an "all or nothing" type of failure criterion. At first, the Multistate Fault Tree (MFT) is introduced to describe the multistate systems, then the method is put forward which can transform the MFT into Binary Decision Diagram (BDD). Secondly, a new algorithm is presented which combines the characters of multistate and multiphase and can obtain a single model of all phases. Finally, the case study shows that the method is available and can reduce the complexity of the PMS model.

Index Terms—Phased mission system, binary decision diagram, multistate fault tree.

The authors are with the Department of Management Science, Naval University of Engineering, Wuhan, China (e-mail: yangch@nudt.edu.cn, hutao188@21.cn).

[PDF]

Cite: Tao Hu and Chun Hui Yang, "Study on Reliability Model of Multistate Phased Mission System Based on BDD," International Journal of Engineering and Technology vol. 8, no. 5, pp. 334-337, 2016.

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