• May 03, 2016 News! Vol.7, No.5 has been indexed by EI(Inspec)!   [Click]
  • May 03, 2016 News! Vol.7, No.4 has been indexed by EI(Inspec)!   [Click]
  • Feb 08, 2017 News!Welcome Dr. Lei Chen from China to join the Editorial board of IJET.   [Click]
General Information
Editor-in-chief
Prof. T. Hikmet Karakoc
Anadolu University, Faculty of Aeronautics and Astronautics, Turkey

IJET 2016 Vol.8(5): 371-374 ISSN: 1793-8236
DOI: 10.7763/IJET.2016.V8.915

A Study on the Run Length Distribution of Synthetic X Chart

Z. L. Chong, Michael B. C. Khoo, and H. W. You
Abstract—Quality is a vital element in every field. In order to compete among the competitors, the manufacturer or service provider should produce or provide quality product or service. However, before a product or service can be considered as having an acceptable quality level, all the processes producing the product (or providing the service) should be in-control. The synthetic X chart consists of two sub-charts, i.e. the X /S sub-chart and CRL/S sub-chart. The synthetic X chart is used to detect shifts in the process mean. In this paper, we study the percentage points (percentiles) of the run length distribution of the synthetic X chart so as to provide practitioners with a more complete understanding of the behaviour of the chart, instead of the sole dependence on the average run length (ARL).

Index Terms—Average run length (ARL), conforming run length (CRL), run length distribution, synthetic X chart.

The authors are with the School of Mathematical Sciences, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia (e-mail: chong.zhilin@gmail.com, mkbc@usm.my, you.woon@yahoo.com).

[PDF]

Cite: Z. L. Chong, Michael B. C. Khoo, and H. W. You, "A Study on the Run Length Distribution of Synthetic X Chart," International Journal of Engineering and Technology vol. 8, no. 5, pp. 371-374, 2016.

Copyright © 2008-2015. International Journal of Engineering and Technology. All rights reserved. 
E-mail: ijet@vip.163.com